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FEC CV300B Diode Tester

The CV300B tests silicon Transient Voltage Suppressor (TVS) diodes, uni-polar and bipolar. The waveform used for the main test is the 10/1000Ás waveform.

The tester can also produce 8/20Ás and 6/70Ás exponential waveforms, 8.3ms half sine and rectangle pulses.

These tests not only prove the ability of the DUT to endure the pulses without failure, but also measure the peak voltage across the device during the pulse.

The CV300B can also measure the VZ of the device both before and after the pulse. Limits may be applied to the absolute value of these VZ tests and to the difference between them. If the initial VZ is outside the programmed limits, the part can be rejected and the main pulse not be applied.

IR can be measured before and after the main pulse. This test is intended to detect damage due to the main pulse which is too slight to be detected by the main pulse or VZ test.

The tester is designed to work with one or two automatic handlers or manual test stations. Bin sort outputs sort the parts into good devices that pass all requirements, several classes of rejects, and those parts which were not completely tested because of some fault condition.

These testers are equally at home doing production sorting or accurate QC or HI-REL testing with data-logging and statistics. Reports for statistical process control (SPC) are very easy to produce.

Please note that the CV400 and CV500 are very similar to CV300B and sell for the same price. The difference is that the CV400 and CV500 are designed to produce 15KW pulses, but over a narrower range of voltage.  The CV400 is the low voltage unit and will produce full power to 160V minimum. The CV500 is the high voltage unit which starts where the CV400 leaves off and goes up to 525V.